Date

Place

Room H (Room Hall 1, 1F)
P1. Poster Session I
August 20, 2015 (Thursday)
14:00 ~ 15:30

[P1-131]
14:00 ~ 15:30
Title:A Diamond Hole Pattern with High Sensitivity and Linearity for Capacitive Touch Screen Panels
SeungHee Han, Yoonsu Kang, Jihyun Lee, Dain Kim, and Yuseok Kang (Gyeonggibuk Science High School, Korea)
Abstract: Recently, capacitive touch screen panel (TSP) requires a faster and more accurate touch operation with high sensitivity and linearity which are key performance of the touch screen capability. The sensitivity and linearity are influenced by the pattern of the touch panel. To improve the sensitivity and linearity, the proposed hole diamond pattern is implemented by making four holes inside of the conventional diamond pattern. Be based on the simulation results using Ansys Q3D extractor, Both conventional and proposed patterns were analyzed and compared in order to investigate the sensitivity and linearity performance. The result of simulation, the proposed pattern shows both sensitivity and linearity are improved by decreasing the area of the Rx pattern than conventional diamond pattern. To verify the performance of the proposed diamond hole pattern, we implemented a TSP qualification system with Arduino, PC, TSP, and detection circuits. The linearity of the Both conventional and proposed patterns is tested using a TSP with PCB and indium-tin-oxide (ITO). The measurement results shows that the diamond hole pattern has about 47% lower average linearity error than conventional diamond pattern. Therefore, the proposed diamond hole pattern of the touch panel is suitable for the high performance capacitive TSP applications.
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