Date
Place
- Room G (Room 306)
- 47. Optical Properties of LC
- August 21, 2015 (Friday)
- 09:00 ~ 10:30
- [47-2]
- 09:25 ~ 09:50
- Title:[Invited] Characterization of Anisotropy Profile of Rubbed Polyimide Alignment Layer Using Reflection Ellipsometry
- Min Soo Park (Ajou Univ., Korea), Sang Uk Park (Ellipso Tech. Co., Ltd., Korea), and Sang Youl Kim (Ajou Univ., Korea)
Abstract: We identify formation of an alignment layer after rubbing and quantitatively characterize the aligned layer in terms of its optical anisotropy. The ultra-small optical anisotropy of the rubbed PI is precisely characterized by using an improved reflection ellipsometer whose precision has been enhanced upto 3?=0.005 nm in Retardation. The direction of the optic axis and the magnitude of the optical anisotropy of the aligned layer after rubbing are determined by quantitatively analyzing the measured asymmetric variation of the ellipsometric constants. The variation of both the direction of the optic axis and the magnitude of the optical anisotropy versus rubbing strength is addressed.
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